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Paperback. Zustand: Very Good. No Jacket. This book is in very good condition. There is foxing on the fore edges and some corner bumping. The part of the spine that is normally brown has turned into a blue. There is some cracking at the bottom of the spine Size: 4to - over 9¾" - 12" tall.

Paperback. Zustand: Very Good. No Jacket. This book is in very good condition. There is some foxing on the fore edges and some minor smudging on the covers. The pages have started to yellow slightly Size: 8vo - over 7¾" - 9¾" tall.

Soft cover. Zustand: Fair. 1st Edition. Text is in English. Volume is dampstained and a bit musty; binding also has soil, foxing and wear; cover has stamp indicating that this volume was not accessioned by a Harvard University library; interior has wear and foxing. 154 p., well illustrated. Size: 10 3/16 x 7 1/4 inches. [br 13].…

Zustand: Very Good. 359 pp., Paperback, light wear to spine, else very good. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.…

xxviii, 392p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Astrophysics and Space Science Proceedings. Sprache: Englisch.…

Tip Cells in Vicia faba and Allium cepa (S. A. Liberal Arts and Sci. Fac. Shizuoka Univ. Vol. 3, No. 4) 1963. S. 185 - 192. m. zahlr. Abb. br. -2) Sonderabdruck.

Spindle in Preparations (S. A. Internat. J. of Cytology Vol. 22, No. 3 - 4) 1957. S. 442 - 451. m. zahlr. Abb. br. -2) Sonderabdruck.

Hb without Dj. Zustand: Fine. First Edition. Contains nearly all the papers presented at the Symposium on "Defects and Qualities of Semiconductors" held in Tokyo in May 1984. In immaculate condition throughout. All profits to Amnesty International. Size: 15.5cm - 23.3cm with 261pp.

Hardcover. Zustand: Very Good+. No Dust Jacket. First Edition. Light rubbing and toning overall, brief bumps to the spine ends and corners, and a previous owner's name plate on the front paste-down. Interior pages clean and unmarked. A tight and clean copy. Photos upon request. International shipping billed at cost.; Large 8vo 9" - 10" tall; 464 pages.…

Soft cover. Zustand: Fair. v, 534 pages : illustrations, maps ; 26 cm. English and French. water damaged. pages are warped.

10 pp., 6 figs, gr. 8.

Zustand: As New. Unread book in perfect condition.

Paperback. Zustand: Brand New. 235 pages. 9.00x6.25x0.75 inches. In Stock.

Zustand: New.

Zustand: New.

Paperback. Zustand: New. In shrink wrap.

Paperback. Zustand: New. In shrink wrap.

Zustand: New. In English.

Zustand: As New. Unread book in perfect condition.

Zustand: New.

Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume contains nearly all of the papers presented at the Symposium on 'Defects and Qualities of Semiconductors' which was held in Tokyo on May 17-18, 1984, under the sponsorship of the SOCIETY OF NON-TRADITIONAL TECHNOLOGY. The Symposium was organized by the promoting committee of the research project 'Quality Developement of Semiconductors by Utilization of Crystal Defects' sponsored by the Science and Technology Agency of Japan. Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication. Recently, a new trend has appeared in which crystal defects are positively utilized to improve the device performance and reliability. A typical example is the intrinsic gettering technique for Czochralski silicon. Thus, a new term 'DEFECT ENGINEERING' was born. It is becoming more important to control density and distribution of defects than to eliminate all the defects. Very precise and deep knowledge on defects is required to establish such techniques as generation and development of defects desired depending on type of devices and degree of integration. Electrical, optical and mechanical effects of defects should be also understood correctly. Such knowledge is essential even for eliminating defects from some specified device regions. It is the time now to investigate defect properties and defect kinetics in an energetic way. From this point of view, all the speakers in this symposium were invited among the most active investigators in the field of defect engineering in Japan.…

Paperback. Zustand: Brand New. 272 pages. 9.02x5.99x0.62 inches. In Stock.

Zustand: New. Brand New ! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

Hardcover. Zustand: Brand New. 340 pages. 9.41x6.26x0.91 inches. In Stock.

Zustand: Fine. The book is in fine condition.

Zustand: Fine. Size: 29.4x22.6x0.9cm. 126 pages Number of books: 1 book.

Zustand: Fine. Size: 29.4x22.6x0.9cm. 126 pages Number of books: 1 book.