Anbieter: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Deutschland
XIX, 208 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
Sprache: Deutsch
Verlag: Editura Didactica Si Pedagogica, Bukarest, 1973
Anbieter: Lektor e.K., Hainburg, Deutschland
Erstausgabe
Gebunden. Zustand: Second Hand. Zustand des Schutzumschlags: Kein Schutzumschlag. 1. Auflage. Text in Rumänisch.
Zustand: New.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 115,41
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 115,41
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Zustand: New. pp. 208.
Zustand: New. pp. XIX, 208 136 illus., 134 illus. in color. 1 Edition NO-PA16APR2015-KAP.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 151,26
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 228 pages. 9.25x6.10x0.54 inches. In Stock.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 153,22
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 230 pages. 9.25x6.10x0.67 inches. In Stock.
Sprache: Englisch
Verlag: Springer International Publishing, 2020
ISBN 10: 3030200531 ISBN 13: 9783030200534
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware;Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow;Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems;Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both;Includes coverage of resilient aspects of emerging applications such as IoT.
Sprache: Englisch
Verlag: Springer International Publishing, 2019
ISBN 10: 3030200507 ISBN 13: 9783030200503
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware;Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow;Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems;Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both;Includes coverage of resilient aspects of emerging applications such as IoT.
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
EUR 164,39
Anzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Sprache: Rumänisch
Verlag: Cluj-Napoca : Editura Dacia, 1980
24,5 x 17,5 cm. Zustand: Sehr gut. 370 Seiten Leg?tura din pânz? este în stare foarte bun?, atât la interior, cât ?i la exterior. V? rug?m s? consulta?i fotografiile noastre. Leineneinband in sehr gutem Zustand, innen wie außen sehr gut. Bitte beachten Sie unsere Bilder. PU-162 ro Gewicht in Gramm: 920.
Sprache: Englisch
Verlag: Springer International Publishing Aug 2020, 2020
ISBN 10: 3030200531 ISBN 13: 9783030200534
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware;Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow;Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems;Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both;Includes coverage of resilient aspects of emerging applications such as IoT. 228 pp. Englisch.
Sprache: Englisch
Verlag: Springer International Publishing Jun 2019, 2019
ISBN 10: 3030200507 ISBN 13: 9783030200503
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware;Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow;Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems;Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both;Includes coverage of resilient aspects of emerging applications such as IoT. 228 pp. Englisch.
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 133,43
Anzahl: 4 verfügbar
In den WarenkorbZustand: New. Print on Demand pp. 208.
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 133,69
Anzahl: 4 verfügbar
In den WarenkorbZustand: New. Print on Demand pp. XIX, 208 136 illus., 134 illus. in color.
Sprache: Englisch
Verlag: Springer International Publishing, 2019
ISBN 10: 3030200507 ISBN 13: 9783030200503
Anbieter: moluna, Greven, Deutschland
EUR 92,27
Anzahl: Mehr als 20 verfügbar
In den WarenkorbGebunden. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents novel techniques, tested with experiments on real hardwareDiscusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flowProvides circuit-architecture.
Sprache: Englisch
Verlag: Springer International Publishing, 2020
ISBN 10: 3030200531 ISBN 13: 9783030200534
Anbieter: moluna, Greven, Deutschland
EUR 92,27
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents novel techniques, tested with experiments on real hardwareDiscusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flowProvides circuit-architecture.
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Zustand: New. PRINT ON DEMAND pp. 208.
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Zustand: New. PRINT ON DEMAND pp. XIX, 208 136 illus., 134 illus. in color.