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Verlag: IEEE, 1987
ISBN 10: 0879422262ISBN 13: 9780879422264
Anbieter: HPB-Red, Dallas, TX, USA
Buch
Paperback. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!.
Verlag: Kluwer Academic Publishers, Dordrecht, Holland, 1997
ISBN 10: 0792380797ISBN 13: 9780792380795
Anbieter: PsychoBabel & Skoob Books, Didcot, Oxfordshire, OXON, Vereinigtes Königreich
Buch Erstausgabe
hardcover. Zustand: Very Good. Zustand des Schutzumschlags: No Dust Jacket. First Edition. Hardback in very good condition. Printed boards, a little scuffed; previous owner's name on FEP, no jacket as issued; contents clean, sound, bright. TPW. Used.
Verlag: Taylor & Francis Group, 1988
ISBN 10: 085274398XISBN 13: 9780852743980
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
Buch
Zustand: Used. pp. 304.
Verlag: Springer, 1989
ISBN 10: 0792390547ISBN 13: 9780792390541
Anbieter: Solr Books, Skokie, IL, USA
Buch
Zustand: Good.
Verlag: Springer, 1989
ISBN 10: 0792390547ISBN 13: 9780792390541
Anbieter: BookDepart, Shepherdstown, WV, USA
Buch
Hardcover. Zustand: Very Good. Hardcover; fading and light shelf wear to exterior; light fading to page edges; otherwise in very good condition with clean text, firm binding.
Verlag: IEEE Publications,U.S., 1987
ISBN 10: 0879422262ISBN 13: 9780879422264
Anbieter: Ammareal, Morangis, Frankreich
Buch
Softcover. Zustand: Bon. Ancien livre de bibliothèque. Petite(s) trace(s) de pliure sur la couverture. Légères traces d'usure sur la couverture. Couverture légèrement déchirée. Edition 1987. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Slightly creased cover. Slight signs of wear on the cover. Slightly torn cover. Edition 1987. Ammareal gives back up to 15% of this item's net price to charity organizations.
Anbieter: Celler Versandantiquariat, Eicklingen, Deutschland
Verbandsmitglied: GIAQ
Buch
Kluwer, Boston, 1990. XII, 291 pages with some graphics, hardcover, (former library book)--- 750 Gramm.
Verlag: Springer, 1997
ISBN 10: 0792380797ISBN 13: 9780792380795
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Buch
Hardcover. book.
Verlag: Springer, 1997
ISBN 10: 0792380797ISBN 13: 9780792380795
Anbieter: GoldenWavesOfBooks, Fayetteville, TX, USA
Buch
Hardcover. Zustand: new. New. Fast Shipping and good customer service.
Verlag: Springer, 1997
ISBN 10: 0792380797ISBN 13: 9780792380795
Anbieter: BennettBooksLtd, North Las Vegas, NV, USA
Buch
Zustand: New. New. In shrink wrap. Looks like an interesting title! 0.95.
Verlag: Ieee, 1987
ISBN 10: 0879422262ISBN 13: 9780879422264
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Buch
Paperback. Zustand: Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. book.
Verlag: Springer, 1997
ISBN 10: 0792380797ISBN 13: 9780792380795
Anbieter: booksXpress, Bayonne, NJ, USA
Buch
Hardcover. Zustand: new.
Verlag: Springer, 2012
ISBN 10: 1461346398ISBN 13: 9781461346395
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Buch
Zustand: New.
Verlag: Springer, 1997
ISBN 10: 0792380797ISBN 13: 9780792380795
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Buch
Zustand: New.
Verlag: Springer, 1990
ISBN 10: 0792390547ISBN 13: 9780792390541
Anbieter: Ammareal, Morangis, Frankreich
Buch
Hardcover. Zustand: Très bon. Ancien livre de bibliothèque. Petite(s) trace(s) de pliure sur la couverture. Légères traces d'usure sur la couverture. Salissures sur la tranche. Edition 1990. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Slightly creased cover. Slight signs of wear on the cover. Stains on the edge. Edition 1990. Ammareal gives back up to 15% of this item's net price to charity organizations.
Verlag: Springer US, 2012
ISBN 10: 1461346398ISBN 13: 9781461346395
Anbieter: Buchpark, Trebbin, Deutschland
Buch
Zustand: Sehr gut. Zustand: Sehr gut - Gepflegter, sauberer Zustand. | Seiten: 176 | Sprache: Englisch.
Verlag: Springer US Sep 2012, 2012
ISBN 10: 1461346398ISBN 13: 9781461346395
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Buch Print-on-Demand
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing. 176 pp. Englisch.
Verlag: Springer US, 1997
ISBN 10: 0792380797ISBN 13: 9780792380795
Anbieter: moluna, Greven, Deutschland
Buch Print-on-Demand
Gebunden. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in .
Verlag: Springer US, 2012
ISBN 10: 1461346398ISBN 13: 9781461346395
Anbieter: moluna, Greven, Deutschland
Buch Print-on-Demand
Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in .
Verlag: Springer US, 2012
ISBN 10: 1461346398ISBN 13: 9781461346395
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.
Verlag: Springer US, 1997
ISBN 10: 0792380797ISBN 13: 9780792380795
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.
Verlag: Springer, 1989
ISBN 10: 0792390547ISBN 13: 9780792390541
Anbieter: booksXpress, Bayonne, NJ, USA
Buch
Hardcover. Zustand: new.
Verlag: Springer US Nov 1997, 1997
ISBN 10: 0792380797ISBN 13: 9780792380795
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Buch Print-on-Demand
Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing. 176 pp. Englisch.
Verlag: Springer, 2011
ISBN 10: 1461288169ISBN 13: 9781461288169
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Buch
Zustand: New.
Verlag: Springer, 1989
ISBN 10: 0792390547ISBN 13: 9780792390541
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Buch
Zustand: New.
Verlag: Springer US, 1989
ISBN 10: 0792390547ISBN 13: 9780792390541
Anbieter: moluna, Greven, Deutschland
Buch Print-on-Demand
Gebunden. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufac.
Verlag: Springer US, 2011
ISBN 10: 1461288169ISBN 13: 9781461288169
Anbieter: moluna, Greven, Deutschland
Buch Print-on-Demand
Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufac.
Verlag: Springer, 2012
ISBN 10: 1461346398ISBN 13: 9781461346395
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Buch
Paperback. Zustand: Like New. Like New. book.
Verlag: Adam Hilger, 1988
ISBN 10: 085274398XISBN 13: 9780852743980
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Buch
Hardcover. Zustand: Like New. Like New. book.