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EA, 183 S., OKart., gut erhalten, Regensburger geographische Schriften, Heft 25 Aufgrund der EPR-Regelung kann in folgende Länder KEIN Versand mehr erfolgen: Bulgarien, Finnland, Frankreich, Griechenland, Luxemburg, Österreich, Polen, Rumänien, Schweden, Slowakei, Spanien.

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Zustand: as new. Berlin & New York : Springer, 1989. Hardcover. xi, 394 pp. illustrations. 24 cm. (Springer proceedings in physics, 35). Orig. edition. - This book contains the papers presented at the international symposium Polycrys talline Semiconductors - Grain Boundaries and Interfaces (POLYSE '88) that was held in Malente, FRG, from August 29 to September 2, 1988. This conference has two roots: Firstly, it is a successor to a conference on polycrystalline semi conductors held in Perpignan, France, in 1982 and to a summer school in Erice, Italy, in 1984. Secondly, it continues a series of German workshops on polycrys talline semiconductors, which have been organized every year since 1983 by two of the present editors (H. P. S. and J. H. W. ) in Stuttgart, FRG. As in these previ ous workshops, the symposium POLYSE '88 also tried to bridge the gap between fundamental research and technological aspects of polycrystalline semiconductors with emphasis on physical properties. In order to realize this conception, 12 scientists recognized in their fields were invited to give reviews of their respective work. The expert presentations of these scientists complemented by all other contributions, including an ad hoc evening workshop on the chemical analysis of grain boundaries by scanning tunneling microscopy, resulted in a lively and rewarding symposium. We would particularly like to thank the invited speakers for their talks, as well as for undertaking the task of refereeing the submitted papers. These speakers are: L. N. Aleksandrov Y. Ishida P. Pirouz A. Bourret J. D. Joannopoulos H. W. Schock H. Cerva L. L. Kazmerski H. Teichler F. Greuter S. Martinuzzi K. N. Condition : as new copy. ISBN 9783540508878. Keywords : PHYSICS,

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 412 | Sprache: Englisch | Produktart: Bücher | This book contains the papers presented at the international symposium Polycrys­ talline Semiconductors - Grain Boundaries and Interfaces (POLYSE '88) that was held in Malente, FRG, from August 29 to September 2, 1988. This conference has two roots: Firstly, it is a successor to a conference on polycrystalline semi­ conductors held in Perpignan, France, in 1982 and to a summer school in Erice, Italy, in 1984. Secondly, it continues a series of German workshops on polycrys­ talline semiconductors, which have been organized every year since 1983 by two of the present editors (H. P. S. and J. H. W. ) in Stuttgart, FRG. As in these previ­ ous workshops, the symposium POLYSE '88 also tried to bridge the gap between fundamental research and technological aspects of polycrystalline semiconductors with emphasis on physical properties. In order to realize this conception, 12 scientists recognized in their fields were invited to give reviews of their respective work. The expert presentations of these scientists complemented by all other contributions, including an ad hoc evening workshop on the chemical analysis of grain boundaries by scanning tunneling microscopy, resulted in a lively and rewarding symposium. We would particularly like to thank the invited speakers for their talks, as well as for undertaking the task of refereeing the submitted papers. These speakers are: L. N. Aleksandrov Y. Ishida P. Pirouz A. Bourret J. D. Joannopoulos H. W. Schock H. Cerva L. L. Kazmerski H. Teichler F. Greuter S. Martinuzzi K. N.

Zustand: Gut. Zustand: Gut | Seiten: 565 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Hardcover. Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02453 3540508872 Sprache: Englisch Gewicht in Gramm: 1050.

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Zustand: New. pp. 568.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 656 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Paperback. Zustand: Brand New. reprint edition. 565 pages. 9.25x6.10x1.20 inches. In Stock.

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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains papers that were presented at the International Conference on Polycrystalline Semiconductors - Grain Boundaries, Dislocations and Het erointerfaces - (POLYSE '90), which was held in Schwabisch Hall, FRG, from July 30 to August 3, 1990. This conference was a satellite conference of the 20th International Conference on the Physics of Semiconductors. POLYSE '90, like its predecessor POLYSE '88, brought together scientists from research in stitutions and industrial laboratories with a view to bridging the gap between fundamental and technological aspects of polycrystalline semiconductors. With this aim, a total of 14 recognized scientists from universities and in dustry were invited to review their fields of interest. The expert presentations of these scientists were complemented by contributed papers and poster con tributions, the authors of which were additionally allowed four minutes for an oral summary. This combination of different types of presentation led to very lively and stimulating discussions.

Zustand: Gut. 394 Seiten Exemplar aus einer wissenchaftlichen Bibliothek Sprache: Englisch Gewicht in Gramm: 969 0,0 x 0,0 x 0,0 cm, Gebundene Ausgabe.

Zustand: New. pp. 412.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains the papers presented at the international symposium Polycrys talline Semiconductors - Grain Boundaries and Interfaces (POLYSE '88) that was held in Malente, FRG, from August 29 to September 2, 1988. This conference has two roots: Firstly, it is a successor to a conference on polycrystalline semi conductors held in Perpignan, France, in 1982 and to a summer school in Erice, Italy, in 1984. Secondly, it continues a series of German workshops on polycrys talline semiconductors, which have been organized every year since 1983 by two of the present editors (H. P. S. and J. H. W. ) in Stuttgart, FRG. As in these previ ous workshops, the symposium POLYSE '88 also tried to bridge the gap between fundamental research and technological aspects of polycrystalline semiconductors with emphasis on physical properties. In order to realize this conception, 12 scientists recognized in their fields were invited to give reviews of their respective work. The expert presentations of these scientists complemented by all other contributions, including an ad hoc evening workshop on the chemical analysis of grain boundaries by scanning tunneling microscopy, resulted in a lively and rewarding symposium. We would particularly like to thank the invited speakers for their talks, as well as for undertaking the task of refereeing the submitted papers. These speakers are: L. N. Aleksandrov Y. Ishida P. Pirouz A. Bourret J. D. Joannopoulos H. W. Schock H. Cerva L. L. Kazmerski H. Teichler F. Greuter S. Martinuzzi K. N.

Paperback. Zustand: Brand New. reprint edition. 412 pages. 9.60x6.69x1.00 inches. In Stock.

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Orig.-Broschur. Zustand: Sehr gut. 114 Seiten, mehrere Abbildungen und Bilder, unbenutztes Exemplar.

Hardcover. Zustand: gut. Die Angiographie ist immer noch eines der häufigsten radiologischen Spezialverfahren im klinischen Alltag. Die mit dem Eingriff verbundene Invasivität stellt besondere Anforderungen an Anfänger und Fortgeschrittene und erfordert eine entsprechende praktische und theoretische Ausbildung. Diesen Bedürfnissen wird das Werk in besonderer Weise gerecht- Ausführliche Darstellung von Grundlagen und Technik der Angiographie und Gefäßanatomie - Viele praktisch umsetzbare Tipps und Tricks Komplette Darstellung der angiographischen Diagnostik (inkl. Neuro-Angiographie) - alle Gefäße und alle Regionen. Dieses Buch ist wesentlich besser strukturiert und detaillierter als viele neuere Werke deshalb habe ich mich dafür entschieden und es nicht bereut - super zur Vorbereitung eines Eingriffs! Angiographie (Gebundene Ausgabe) von Hans Schild Gebundene Ausgabe 392 Seiten Verlag Thieme, Stuttgart; Auflage 2., vollst. überarb. u. erw. A. (21. Mai 2003) Sprache Deutsch ISBN-10 3131278021 ISBN-139 78-3131278029 Größe und/oder Gewicht 28,4 x 21,6 x 2,8 cm Medizin Pharmazie Klinik Praxis Angiographie Klinische Fächer Radiologie Radiologen RRR-Referenzreihe Radiologische Diagnostik ISBN-10 3-13-127802-1 / 3131278021 ISBN-13 978-3-13-127802-9 / 9783131278029 Angiographie (Gebundene Ausgabe) von Hans Schild RRR - Referenz-Reihe Radiologie Thieme Georg Verlag MVS Medizinverlage Angiografie Angiogramm Arteriographie Angiogramm Angiographie Subtraktionsangiographie Angiographie (Gebundene Ausgabe) von Hans Schild RRR - Referenz-Reihe Radiologie Hans H. Schild Mark Born, Bernhard Eckert, Ulrich Hofer, Harald A. Kaltenborn, Wilhelm Kersjes, Jürgen Malms, Jürgen Remig, Klaus Schunk, Holger Strunk, Horst Urbach, Kai Wilhelm Mitarbeit Ulrich Mödder In deutscher Sprache. 392 pages. 28,4 x 21,6 x 2,8 cm Auflage: 2., vollst. überarb. u. erw. A. (21. Mai 2003).

Hardcover. Zustand: gut. 1994. Die Angiographie ist immer noch eines der häufigsten radiologischen Spezialverfahren im klinischen Alltag. Die mit dem Eingriff verbundene Invasivität stellt besondere Anforderungen an Anfänger und Fortgeschrittene und erfordert eine entsprechende praktische und theoretische Ausbildung. Diesen Bedürfnissen wird das Werk in besonderer Weise gerecht- Ausführliche Darstellung von Grundlagen und Technik der Angiographie und Gefäßanatomie - Viele praktisch umsetzbare Tipps und Tricks Komplette Darstellung der angiographischen Diagnostik (inkl. Neuro-Angiographie) - alle Gefäße und alle Regionen. Dieses Buch ist wesentlich besser strukturiert und detaillierter als viele neuere Werke deshalb habe ich mich dafür entschieden und es nicht bereut - super zur Vorbereitung eines Eingriffs! Angiographie Hans H. Schild Angiographie - Angiogramm Arteriographie Angiogramme Angiographie Subtraktionsangiographie Zusatzinfo 221 Abb., 43 Tab. Maße 170 x 240 mm Einbandart Paperback ISBN-10 3-13-127801-3 / 3131278013 ISBN-13 978-3-13-127801-2 / 9783131278012 In deutscher Sprache. 392 pages. 288x219x28 mm.

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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book contains papers that were presented at the International Conference on Polycrystalline Semiconductors - Grain Boundaries, Dislocations and Het erointerfaces - (POLYSE '90), which was held in Schwabisch Hall, FRG, from July 30 to August 3, 1990. This conference was a satellite conference of the 20th International Conference on the Physics of Semiconductors. POLYSE '90, like its predecessor POLYSE '88, brought together scientists from research in stitutions and industrial laboratories with a view to bridging the gap between fundamental and technological aspects of polycrystalline semiconductors. With this aim, a total of 14 recognized scientists from universities and in dustry were invited to review their fields of interest. The expert presentations of these scientists were complemented by contributed papers and poster con tributions, the authors of which were additionally allowed four minutes for an oral summary. This combination of different types of presentation led to very lively and stimulating discussions. 568 pp. Englisch.

Zustand: New. Print on Demand pp. 568 329 Figures, 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

Zustand: New. PRINT ON DEMAND pp. 568.

Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This volume discusses the structural, chemical, and electronic properties of grain boundaries, dislocations, and hetero-interfaces in polycrystalline semiconductors. Researchers and students in this field will find here much valuable information relevant to both fundamental research and technological applications.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 568 pp. Englisch.

Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book contains the papers presented at the international symposium Polycrys talline Semiconductors - Grain Boundaries and Interfaces (POLYSE '88) that was held in Malente, FRG, from August 29 to September 2, 1988. This conference has two roots: Firstly, it is a successor to a conference on polycrystalline semi conductors held in Perpignan, France, in 1982 and to a summer school in Erice, Italy, in 1984. Secondly, it continues a series of German workshops on polycrys talline semiconductors, which have been organized every year since 1983 by two of the present editors (H. P. S. and J. H. W. ) in Stuttgart, FRG. As in these previ ous workshops, the symposium POLYSE '88 also tried to bridge the gap between fundamental research and technological aspects of polycrystalline semiconductors with emphasis on physical properties. In order to realize this conception, 12 scientists recognized in their fields were invited to give reviews of their respective work. The expert presentations of these scientists complemented by all other contributions, including an ad hoc evening workshop on the chemical analysis of grain boundaries by scanning tunneling microscopy, resulted in a lively and rewarding symposium. We would particularly like to thank the invited speakers for their talks, as well as for undertaking the task of refereeing the submitted papers. These speakers are: L. N. Aleksandrov Y. Ishida P. Pirouz A. Bourret J. D. Joannopoulos H. W. Schock H. Cerva L. L. Kazmerski H. Teichler F. Greuter S. Martinuzzi K. N. 412 pp. Englisch.