Trzaska hubert (25 Ergebnisse)
- Hardcover
- Erstausgabe
Anbieter: Feldman's Books, Menlo Park, CA, USAFeldman's Books
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Hardcover. Zustand: Very Fine. First Edition. No markings.
Sprache: Englisch
Verlag: Scitech, NJ, 2014
- Hardcover
Anbieter: Feldman's Books, Menlo Park, CA, USAFeldman's Books
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Hardcover. Zustand: Very Fine. First Edition. No markings.
- Hardcover
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Hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
- Hardcover
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Hardcover. Zustand: New. Clean, unread copy in New condition. No marking or writing in the book - text is completely clean, and the book appears unread. Book is still in plastic shrink-wrap from the publisher. Covers are clean and show no shelf wear. Printed hardcover as issued by the publisher - no dust jacket. Binding is firm.
- Hardcover
Anbieter: GreatBookPrices, Columbia, MD, USAGreatBookPrices
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EUR 100,69
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- Hardcover
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- Hardcover
Anbieter: Rarewaves USA, OSWEGO, IL, USARarewaves USA
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EUR 110,48
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Hardback. Zustand: New. Electromagnetic Field Standards and Exposure Systems covers the broader fields of measurements in telecommunications, radio navigation, radio astronomy, bioscience, and free ranging EM radiation and helps to develop the following measurement standards; proper calibration of the measuring instrumentexterna…l environmental factors that affect accuracycompetence and training of the instrument operator.
- Hardcover
Anbieter: Rarewaves USA, OSWEGO, IL, USARarewaves USA
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EUR 110,67
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Hardback. Zustand: New. This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understandi…ng of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
- Hardcover
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes KönigreichGreatBookPricesUK
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EUR 94,64
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Zustand: New.
- Hardcover
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Zustand: New. In.
- Hardcover
Anbieter: Rarewaves.com USA, London, LONDO, Vereinigtes KönigreichRarewaves.com USA
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EUR 123,55
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Hardback. Zustand: New. This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understandi…ng of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
- Hardcover
Anbieter: GreatBookPrices, Columbia, MD, USAGreatBookPrices
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EUR 124,25
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Zustand: As New. Unread book in perfect condition.
- Hardcover
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes KönigreichGreatBookPricesUK
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Zustand: New.
- Hardcover
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EUR 130,66
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Zustand: As New. Unread book in perfect condition.
- Hardcover
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EUR 132,85
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Zustand: As New. Unread book in perfect condition.
- Hardcover
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes KönigreichMispah books
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Hardcover. Zustand: Like New. Like New. book.
- Hardcover
Anbieter: GreatBookPrices, Columbia, MD, USAGreatBookPrices
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Zustand: As New. Unread book in perfect condition.
- Hardcover
Anbieter: Rarewaves USA United, OSWEGO, IL, USARarewaves USA United
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EUR 112,95
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Hardback. Zustand: New. Electromagnetic Field Standards and Exposure Systems covers the broader fields of measurements in telecommunications, radio navigation, radio astronomy, bioscience, and free ranging EM radiation and helps to develop the following measurement standards; proper calibration of the measuring instrumentexterna…l environmental factors that affect accuracycompetence and training of the instrument operator.
- Hardcover
Anbieter: Rarewaves USA United, OSWEGO, IL, USARarewaves USA United
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EUR 113,14
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Hardback. Zustand: New. This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understandi…ng of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
- Hardcover
Anbieter: Revaluation Books, Exeter, Vereinigtes KönigreichRevaluation Books
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EUR 148,41
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Hardcover. Zustand: Brand New. 201 pages. 9.00x6.00x0.75 inches. In Stock.
- Hardcover
Anbieter: Revaluation Books, Exeter, Vereinigtes KönigreichRevaluation Books
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EUR 148,67
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Hardcover. Zustand: Brand New. 2nd revised edition edition. 230 pages. 9.09x6.10x0.71 inches. In Stock.
- Hardcover
Anbieter: moluna, Greven, Deutschlandmoluna
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EUR 108,43
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Zustand: New. Über den AutorrnrnPawel Bienkowski is affiliated with the EM Environment Protection Lab at the Technical University of Wroclaw, Poland where he researches electromagnetic compatibility and electromagnetic field measurements and standards.
- Hardcover
Anbieter: moluna, Greven, Deutschlandmoluna
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EUR 110,55
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Zustand: New. Über den AutorrnrnDr Eugeniusz Grudzinski, born in 1948 in Wroclaw, Poland. He completed his MSc EE, DSc and Ph.Dr. degrees at the Technical University of Wroclaw in 1973, 1981 and 1998, respectively. He is currently Head of the EMF Stan.
- Hardcover
Anbieter: Rarewaves.com UK, London, Vereinigtes KönigreichRarewaves.com UK
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EUR 116,19
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Hardback. Zustand: New. This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understandi…ng of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
Sprache: Englisch
Verlag: Institution Of Engineering & Technology Jun 2012, 2012
- Hardcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
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EUR 133,32
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Buch. Zustand: Neu. Neuware - This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough under…standing of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
