ISBN: 9780892527656 - automated inspection and measurement (proceedings of spie) (1 Ergebnisse)
Automated Inspection and Measurement (Proceedings of Spie)
Chen, Michael J. W. (Editor); Vercruyssen, M.; Luck, Randall L.; Porquet, C.; et.al.
Sprache: Englisch
Verlag: SPIE PRESS-The International Society for Optical Engineering; Society of Photo Optical, Bellingham, WA, U.S.A., 1987
- Softcover
- Erstausgabe
Anbieter: SUNSET BOOKS 2, Newark, OH, USASUNSET BOOKS 2
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Paperback. Zustand: Very Good. No Jacket. 1st. With full markings, labels, pocket and stamps, clean text. Minor wear on edges/corners. Automated Inspection and Measurement - Volume 730, Proceedings of SPIE - The International Society for Optical Engineering, 28-30 October 1986, Cambridge, Massachusetts. Size: 4to. Ex-Library. …
