ISBN: 9784431703365 - analytical electron microscopy for materials science (14 Ergebnisse)

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Paperback or Softback. Zustand: New. Analytical Electron Microscopy for Materials Science. Book.

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Paperback. Zustand: Brand New. 2002 edition. 156 pages. 10.25x7.25x0.25 inches. In Stock.

Soft cover. Zustand: Very Good. No Jacket. 1st Edition. 2002.Softcover.Very good condition.152 pages.Ships from Japan.Usually ships in 1-2 working days.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.…

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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation. 168 pp. Englisch.…

Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Detailed explanation of the basic principles and the latest improvements in analytical electron microscopyGenerous illustrations and experimental dataAnalytical electron microscopy is one of the most powerful tools today for characterization of the .…

Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 168 pp. Englisch.…