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In den WarenkorbZustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. No dust jacket. Library sticker on front cover. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9781441965325.
Sprache: Englisch
Verlag: Springer-Verlag Publishing, 2010
ISBN 10: 1441965327 ISBN 13: 9781441965325
Anbieter: Salish Sea Books, Bellingham, WA, USA
Zustand: Like New. 2. Fine/As New; Hardcover; 2nd Edition; This book is brand new and still sealed in the publisher's original shrinkwrap; Perfect, new condition; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); 1.8 lbs; Dark orange covers with title in white lettering; 2010, Springer-Verlag Publishing; 289 pages; "Advanced Computing in Electron Microscopy," by Earl J. Kirkland.
hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 127,74
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In den WarenkorbZustand: As New. Unread book in perfect condition.
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
EUR 152,16
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In den WarenkorbZustand: New.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 165,84
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In den WarenkorbPaperback. Zustand: Brand New. 2nd edition. 299 pages. 9.25x6.10x0.68 inches. In Stock.
Taschenbuch. Zustand: Neu. Advanced Computing in Electron Microscopy | Earl J. Kirkland | Taschenbuch | x | Englisch | 2014 | Springer | EAN 9781489995094 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
EUR 168,43
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In den WarenkorbZustand: As New. Unread book in perfect condition.
Sprache: Englisch
Verlag: Springer Nature Switzerland AG, CH, 2020
ISBN 10: 3030332594 ISBN 13: 9783030332594
Anbieter: Rarewaves.com USA, London, LONDO, Vereinigtes Königreich
EUR 194,84
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In den WarenkorbHardback. Zustand: New. Third Edition 2020.
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif cult for beginners to get started in this eld.
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
EUR 182,46
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In den WarenkorbPaperback. Zustand: Like New. Like New. book.
Anbieter: Books Puddle, New York, NY, USA
Zustand: New.
Zustand: New.
Taschenbuch. Zustand: Neu. Advanced Computing in Electron Microscopy | Earl J. Kirkland | Taschenbuch | xii | Englisch | 2021 | Springer | EAN 9783030332624 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
Sprache: Englisch
Verlag: Springer Nature Switzerland AG, CH, 2020
ISBN 10: 3030332594 ISBN 13: 9783030332594
Anbieter: Rarewaves.com UK, London, Vereinigtes Königreich
EUR 183,43
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In den WarenkorbHardback. Zustand: New. Third Edition 2020.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 274,23
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 3rd edition. 368 pages. 9.25x6.10x0.79 inches. In Stock.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 276,26
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In den WarenkorbHardcover. Zustand: Brand New. 3rd edition. 354 pages. 9.25x6.00x1.00 inches. In Stock.
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
EUR 261,17
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In den WarenkorbHardcover. Zustand: New. New. book.
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
EUR 289,80
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In den WarenkorbPaperback. Zustand: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Anbieter: Brook Bookstore On Demand, Napoli, NA, Italien
EUR 94,25
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In den WarenkorbZustand: new. Questo è un articolo print on demand.
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif cult for beginners to get started in this eld. 300 pp. Englisch.
Anbieter: Brook Bookstore On Demand, Napoli, NA, Italien
EUR 142,27
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In den WarenkorbZustand: new. Questo è un articolo print on demand.
Anbieter: Brook Bookstore On Demand, Napoli, NA, Italien
EUR 142,27
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In den WarenkorbZustand: new. Questo è un articolo print on demand.