Advanced scanning electron microscopy von echlin patrick (16 Ergebnisse)
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Echlin, Patrick; Fiori, C.E.; Goldstein, Joseph; Joy, David C.; Newbury, Dale E.
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hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Echlin, Patrick, Fiori, C.E., Goldstein, Joseph, Joy, David C., Newbury, Dale E.
- Hardcover
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Zustand: Good. Second printing, 454 pp., hardcover, ex library, else text clean and binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by…recipient's country.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Newbury Dale E. Joy David C. Goldstein Joseph Fiori C.E. Echlin Patrick
- Hardcover
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Zustand: New. pp. xii + 454.
Advanced Scanning Electron Microscopy And X-ray Microanalysis
Echlin, Patrick; Fiori, C.E.; Goldstein, Joseph; Joy, David C.; Newbury, Dale E.
- Hardcover
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Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Newbury, Dale E.; Joy, David C.; Echlin, Patrick; Fiori, Charles E.; Goldstein, Joseph I.
- Softcover
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Echlin, Patrick; Fiori, C.E.; Goldstein, Joseph; Joy, David C.; Newbury, Dale E.
- Softcover
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Newbury, Dale E.; Joy, David C.; Echlin, Patrick; Fiori, Charles E.; Goldstein, Joseph I.
- Softcover
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin|C.E. Fiori|Joseph Goldstein|David C. Joy|Dale E. Newbury
- Softcover
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Dale E. Newbury David C. Joy Joseph Goldstein C.E. Fiori Patrick Echlin
- Hardcover
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Zustand: Used. pp. xii + 454.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Newbury Dale E. Joy David C. Goldstein Joseph Fiori C.E. Echlin Patrick
- Hardcover
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Zustand: Used. pp. xii + 454.
Advanced Scanning Electron Microscopy and X-ray Microanalysis
Echlin, Patrick/ Fiori, C. E./ Goldstein, Joseph/ Joy, David C./ Newbury, Dale E.
- Softcover
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Paperback. Zustand: Brand New. reprint edition. 466 pages. 8.75x6.00x0.75 inches. In Stock.
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in th…e original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
- Hardcover
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Hardcover. Zustand: Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. SHIPS FROM MULTIPLE LOCATIONS. book.
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Zustand: new. Questo è un articolo print on demand.
- Softcover
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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials… presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course. 476 pp. Englisch.
- Softcover
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Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials pre…sented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 476 pp. Englisch.
