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Hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Design for At-Speed Test, Diagnosis and Measurement
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: ThriftBooks-Dallas, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Bay State Book Company, North Smithfield, RI, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: good. The book is in good condition with all pages and cover intact, including the dust jacket if originally issued. The spine may show light wear. Pages may contain some notes or highlighting, and there might be a "From the library of" label. Boxed set packaging, shrink wrap, or included media like CDs may be missing.
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Design for at-Speed Test, Diagnosis and Measurement
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Better World Books: West, Reno, NV, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: Fine. Used book that is in almost brand-new condition.
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Design for at-Speed Test, Diagnosis and Measurement
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Better World Books, Mishawaka, IN, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Goodwill of Silicon Valley, SAN JOSE, CA, USA
Verkäuferbewertung 4 von 5 Sternen
Zustand: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Goodwill of Silicon Valley, SAN JOSE, CA, USA
Verkäuferbewertung 4 von 5 Sternen
Zustand: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: SatelliteBooks, Burlington, VT, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: As New. Hardcover, no DJ as issued Free of any markings and no writing. Minor shelf-wear. For Additional Information or pictures, Please Inquire.
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hardcover. Zustand: Very Good. Pages are crisp and clean, no marking. Cover is verygood. Binding is tight/good.
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Hardcover. Zustand: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: BennettBooksLtd, San Diego, NV, USA
Verkäuferbewertung 5 von 5 Sternen
hardcover. Zustand: New. In shrink wrap. Looks like an interesting title!
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Design For At-speed Test, Diagnosis And Measurement (frontiers In Electronic Testing Volume 15) (frontiers In Electronic Testing)
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Basi6 International, Irving, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: Brand New. New. US edition. Excellent Customer Service.
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Design For At-speed Test, Diagnosis And Measurement (frontiers In Electronic Testing Volume 15) (frontiers In Electronic Testing)
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: ALLBOOKS1, Direk, SA, Australien
Verkäuferbewertung 5 von 5 Sternen
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Design for AT-Speed Test, Diagnosis and Measurement
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Majestic Books, Hounslow, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
EUR 143,46
EUR 7,44 shipping
Ships from Vereinigtes Königreich to USAAnzahl: 1 verfügbar
In den WarenkorbZustand: New. pp. 260 Illus.
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Design for AT-Speed Test, Diagnosis and Measurement
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Verkäuferbewertung 4 von 5 Sternen
Zustand: New. pp. 260.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Lucky's Textbooks, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Lucky's Textbooks, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
EUR 179,11
EUR 28,60 shipping
Ships from Vereinigtes Königreich to USAAnzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Like New. Like New. book.
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Taschenbuch. Zustand: Neu. Design for AT-Speed Test, Diagnosis and Measurement | Benoit Nadeau-Dostie | Taschenbuch | xvii | Englisch | 2013 | Springer US | EAN 9781475782912 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Design for AT-Speed Test, Diagnosis and Measurement
Buch 37 von 40: Frontiers in Electronic TestingVerlag: Springer US, Springer New York, 2013
ISBN 10: 1475782918 ISBN 13: 9781475782912
Sprache: Englisch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
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Design for AT-Speed Test, Diagnosis and Measurement
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
EUR 225,07
EUR 28,60 shipping
Ships from Vereinigtes Königreich to USAAnzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: Like New. Like New. book.
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Design for At-Speed Test, Diagnosis and Measurement-
Verlag: Kluwer Academic Publishers-, 2000
Anbieter: "Pursuit of Happiness" Books, Oakland, CA, USA
Verkäuferbewertung 4 von 5 Sternen
Hardcover. Zustand: Good. Hardcover/pub.2000/Gd. condition/238 pages- Design-For-Testability (DFT) is explained and demostrated. (H89755). Book.
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Design for AT-Speed Test, Diagnosis and Measurement
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted. 260 pp. Englisch.
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Design for AT-Speed Test, Diagnosis and Measurement
Buch 37 von 40: Frontiers in Electronic TestingAnbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted. 260 pp. Englisch.
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EUR 136,16
EUR 48,99 shipping
Ships from Deutschland to USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as a.
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EUR 136,16
EUR 48,99 shipping
Ships from Deutschland to USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as a.
