Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Zustand: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
Zustand: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
Zustand: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
Hardcover. Zustand: New. ISBN:9788126568543,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition.
Anbieter: UK BOOKS STORE, London, LONDO, Vereinigtes Königreich
EUR 77,92
Anzahl: 9 verfügbar
In den WarenkorbHardcover. Zustand: New. Brand New ! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
Sprache: Englisch
Verlag: Hoboken: Wiley, 2006
Anbieter: Antiquariat Thomas Haker GmbH & Co. KG, Berlin, Deutschland
Verbandsmitglied: GIAQ
Hardcover/Pappeinband. Zustand: Wie neu. 420 pages. Like new. Shrink wrapped. / Wie neu. In Folie verschweißt. Sprache: Englisch Gewicht in Gramm: 1050.
Sprache: Englisch
Verlag: Electronic Industry Press, 2007
ISBN 10: 7121132079 ISBN 13: 9787121132070
Anbieter: liu xing, Nanjing, JS, China
paperback. Zustand: New. Language:Chinese.Paperback. Pages Number: 316 Publisher: Electronic Industry Press Pub. Date:. ESD RF Technology and Circuits is Steven H. Prof. Voldman written by ESD RF Technology and Circuits in the Chinese translation version. ESD RF Technology and Circuits. a systematic introduction to the basics of RF ESD design and concept; RF ESD Design. synthesis and methodological details. such as substitution. Elimination of RF ESD design methods such as isolation. ESD and impedance techniques; RF .
Zustand: New. Well packaged and promptly shipped from California. Partnered with Friends of the Library since 2010.
EUR 129,06
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In den WarenkorbZustand: New.
EUR 131,65
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In den WarenkorbZustand: As New. Unread book in perfect condition.
EUR 121,64
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In den WarenkorbZustand: new.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 123,75
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In den WarenkorbZustand: New. In.
EUR 120,76
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In den WarenkorbZustand: New.
Sprache: Englisch
Verlag: LAP LAMBERT Academic Publishing, 2010
ISBN 10: 3838336429 ISBN 13: 9783838336428
Anbieter: preigu, Osnabrück, Deutschland
Taschenbuch. Zustand: Neu. ESD Protection Challenges | FinFET Technology and RF CMOS Circuits | Steven Thijs (u. a.) | Taschenbuch | 272 S. | Englisch | 2010 | LAP LAMBERT Academic Publishing | EAN 9783838336428 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu.
EUR 132,60
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In den WarenkorbZustand: As New. Unread book in perfect condition.
EUR 144,00
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In den WarenkorbHardback. Zustand: New. New copy - Usually dispatched within 4 working days.
Anbieter: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irland
Erstausgabe
EUR 157,14
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In den WarenkorbZustand: New. Electrostatic Discharge (ESD) within RF devices can result in the malfunctioning of nearby electronic equipment. This volume is designed as the third in a series of three books addressing Electrostatic Discharge (ESD) physics, devices, circuits and design. Num Pages: 420 pages, Illustrations. BIC Classification: TJKR. Category: (P) Professional & Vocational. Dimension: 249 x 173 x 28. Weight in Grams: 934. . 2006. 1st Edition. Hardcover. . . . .
Sprache: Englisch
Verlag: LAP Lambert Academic Publishing, 2010
ISBN 10: 3838336429 ISBN 13: 9783838336428
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
EUR 163,81
Anzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
EUR 190,00
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 1st edition. 420 pages. 9.75x6.75x1.00 inches. In Stock.
EUR 196,24
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. Electrostatic Discharge (ESD) within RF devices can result in the malfunctioning of nearby electronic equipment. This volume is designed as the third in a series of three books addressing Electrostatic Discharge (ESD) physics, devices, circuits and design. Num Pages: 420 pages, Illustrations. BIC Classification: TJKR. Category: (P) Professional & Vocational. Dimension: 249 x 173 x 28. Weight in Grams: 934. . 2006. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
Buch. Zustand: Neu. Neuware - With the growth of high-speed telecommunications and wireless technology, it is becoming increasingly important for engineers to understand radio frequency (RF) applications and their sensitivity to electrostatic discharge (ESD) phenomena. This enables the development of ESD design methods for RF technology, leading to increased protection against electrical overstress (EOS) and ESD.ESD: RF Technology and Circuits:\* Presents methods for co-synthesizisng ESD networks for RF applications to achieve improved performance and ESD protection of semiconductor chips;\* discusses RF ESD design methods of capacitance load transformation, matching network co-synthesis, capacitance shunts, inductive shunts, impedance isolation, load cancellation methods, distributed loads, emitter degeneration, buffering and ballasting;\* examines ESD protection and design of active and passive elements in RF complementary metal-oxide-semiconductor (CMOS), RF laterally-diffused metal oxide semiconductor (LDMOS), RF BiCMOS Silicon Germanium (SiGe), RF BiCMOS Silicon Germanium Carbon (SiGeC), and Gallim Arsenide technology;\* gives information on RF ESD testing methodologies, RF degradation effects, and failure mechanisms for devices, circuits and systems;\* highlights RF ESD mixed-signal design integration of digital, analog and RF circuitry;\* sets out examples of RF ESD design computer aided design methodologies;\* covers state-of-the-art RF ESD input circuits, as well as voltage-triggered to RC-triggered ESD power clamps networks in RF technologies, as well as off-chip protection concepts.Following the authors series of books on ESD, this book will be a thorough overview of ESD in RF technology for RF semiconductor chip and ESD engineers. Device and circuit engineers working in the RF domain, and quality, reliability and failure analysis engineers will also find it a valuable reference in the rapidly growing are of RF ESD design. In addition, it will appeal to graduate students in RF microwave technology and RF circuit design.
Sprache: Englisch
Verlag: LAP LAMBERT Academic Publishing, 2010
ISBN 10: 3838336429 ISBN 13: 9783838336428
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Two main Electro Static Discharge (ESD) challenges lie ahead. Firstly, FinFET technology has only a limited available silicon volume to dissipate the ESD current. Secondly, as CMOS technology downscaling allows Radio Frequency (RF) applications to operate at higher RF frequencies and wider bandwidths, adequate ESD protection needs to be developed without compromising RF performance. This book, therefore, provides an in-depth analysis on ESD protection structures and concepts, implemented in silicon on insulator FinFET technology. Complex dependencies are found for the different ESD performance parameters on both device geometry and process technology. Further, in this book, novel RF-ESD protection solutions are proposed for both narrow- and wideband RF CMOS circuits in most advanced CMOS technologies, with a special emphasis towards CDM protection. This analysis should provide fundamental understanding of the ESD challenges for FinFET technology and RF CMOS circuits, and should be especially useful to everyone working with ESD in the field of product development, support, research or education.
Anbieter: THE SAINT BOOKSTORE, Southport, Vereinigtes Königreich
EUR 147,20
Anzahl: Mehr als 20 verfügbar
In den WarenkorbHardback. Zustand: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 964.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 172,06
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 1st edition. 420 pages. 9.75x6.75x1.00 inches. In Stock. This item is printed on demand.