Testing of Digital Systems

Jha N K and Gupta S

ISBN 10: 0521773563 / ISBN 13: 9780521773560

Verlag: Cambridge University Press, Cambridge, 2003

Beschreibung

From an academic library with the usual stamps etc. This item is heavy and will attract postal surcharges.

Bestandsnummer des Verkäufers 010999

Bibliografische Details

• Titel: Testing of Digital Systems
• Verlag: Cambridge University Press, Cambridge
• Erscheinungsjahr: 2003
• Sprache: Englisch
• ISBN-10: 0521773563
• ISBN-13: 9780521773560
• Einband: Hard Cover
• Auflage: First Edition.
• Zustand: Good
• Zustand des Schutzumschlags: No Jacket

Über diesen Titel

Inhaltsangabe

The most comprehensive and wide ranging book on the testing of semiconductor devices and systems.

Über die Autorinnen und Autoren

Niraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, associate editor of IEEE Transactions on VLSI Systems and The Journal of Electronic Testing: Theory and Applications (JETTA) and a recipient of the AT&T Foundation award and the NEC preceptorship award for research excellence.

Sandeep Gupta is an Associate Professor in the Department of Electrical Engineering at the University of Southern California, USA. He is Co-Director of the M.S. Program in VLSI Design, with research interests in the area of VLSI testing and design. He is a member of the IEEE.