VLSI Design and Test (Paperback)

Brajesh Kumar Kaushik

ISBN 10: 9811074690 / ISBN 13: 9789811074691

Verlag: Springer Verlag, Singapore, Singapore, 2017

Beschreibung

Paperback. This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Bestandsnummer des Verkäufers 9789811074691

Bibliografische Details

• Titel: VLSI Design and Test (Paperback)
• Verlag: Springer Verlag, Singapore, Singapore
• Erscheinungsjahr: 2017
• Sprache: Englisch
• ISBN-10: 9811074690
• ISBN-13: 9789811074691
• Einband: Paperback
• Auflage: 1. Auflage
• Zustand: new

Über diesen Titel

Inhaltsangabe

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.