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Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: HPB-Red, Dallas, TX, USA
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Hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: ThriftBooks-Atlanta, AUSTELL, GA, USA
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Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 1.65.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: ThriftBooks-Dallas, Dallas, TX, USA
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Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 1.65.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: SatelliteBooks, Burlington, VT, USA
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Hardcover. Zustand: As New. Hardcover, no DJ as issued Free of any markings and no writing. Minor shelf-wear. For Additional Information or pictures, Please Inquire.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: The Book Spot, Sioux Falls, SD, USA
Buch
Hardcover. Zustand: New.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: BennettBooksLtd, North Las Vegas, NV, USA
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Zustand: New. New. In shrink wrap. Looks like an interesting title! 1.68.
Verlag: Kluwer Academic Publishers-, 2000
Anbieter: "Pursuit of Happiness" Books, Oakland, CA, USA
Hard Cover. Zustand: Good. Hardcover/pub.2000/Gd. condition/238 pages- Design-For-Testability (DFT) is explained and demostrated. (H89755).
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: Books Puddle, New York, NY, USA
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Zustand: New. pp. 260.
Verlag: Morgan Kaufmann, 2006
ISBN 10: 0123705975ISBN 13: 9780123705976
Anbieter: SGS Trading Inc, Franklin Lakes, NJ, USA
Buch
Hardcover. Zustand: Good. Textbook, May Have Highlights, Notes and/or Underlining, BOOK ONLYNO ACCESS CODE, NO CD, Ships with Emailed Tracking.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: HPB-Movies, Dallas, TX, USA
Buch
hardcover. Zustand: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority!.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: Basi6 International, Irving, TX, USA
Buch
Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Buch
Zustand: New. Brand New Original US Edition.We Ship to PO BOX Address also. EXPEDITED shipping option also available for faster delivery.This item may ship from the US or other locations in India depending on your location and availability.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
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Zustand: New. pp. 260 Illus.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: SMASS Sellers, IRVING, TX, USA
Buch
Zustand: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed. This item may ship from the US or our Overseas warehouse depending on your location and stock availability. We Ship to PO BOX Location also.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: booksXpress, Bayonne, NJ, USA
Buch
Hardcover. Zustand: new.
Verlag: Springer, 2013
ISBN 10: 1475782918ISBN 13: 9781475782912
Anbieter: booksXpress, Bayonne, NJ, USA
Buch
Soft Cover. Zustand: new.
Verlag: Springer US Apr 2013, 2013
ISBN 10: 1475782918ISBN 13: 9781475782912
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Buch Print-on-Demand
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted. 260 pp. Englisch.
Verlag: Springer US, 2013
ISBN 10: 1475782918ISBN 13: 9781475782912
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
Verlag: Springer, 2013
ISBN 10: 1475782918ISBN 13: 9781475782912
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Buch Print-on-Demand
Zustand: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Buch Print-on-Demand
Zustand: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Verlag: Springer, 2013
ISBN 10: 1475782918ISBN 13: 9781475782912
Anbieter: Lucky's Textbooks, Dallas, TX, USA
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Zustand: New.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Buch
Zustand: New.
Verlag: Springer-Verlag New York Inc., 2013
ISBN 10: 1475782918ISBN 13: 9781475782912
Anbieter: THE SAINT BOOKSTORE, Southport, Vereinigtes Königreich
Buch Print-on-Demand
Paperback / softback. Zustand: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
Verlag: Springer US Sep 1999, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Buch Print-on-Demand
Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted. 260 pp. Englisch.
Verlag: Springer US, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: moluna, Greven, Deutschland
Buch Print-on-Demand
Gebunden. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as a.
Verlag: Springer US, 2013
ISBN 10: 1475782918ISBN 13: 9781475782912
Anbieter: moluna, Greven, Deutschland
Buch Print-on-Demand
Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as a.
Verlag: Springer US, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
Verlag: Springer, 1999
ISBN 10: 0792386698ISBN 13: 9780792386698
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Buch
Hardcover. Zustand: Like New. Like New. book.
Verlag: Springer, 2013
ISBN 10: 1475782918ISBN 13: 9781475782912
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Buch
Paperback. Zustand: Like New. Like New. book.