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The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
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T. P. Ma and Paul V. Dressendorfer are the authors of Ionizing Radiation Effects in MOS Devices and Circuits, published by Wiley.
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Ionizing Radiation Effects in MOS Devices and Circuits
Verlag:
Wiley-Interscience Publishing, 1989
ISBN 10: 047184893X
ISBN 13: 9780471848936
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Zustand: Good. Good+ in a Very Good dust jacket; Hardcover; Withdrawn library copy with the standard library markings; Dust jacket is clean and intact with no tears or library tags, and has not been price-clipped (Now fitted with a new, Brodart jacket protector); Light wear to the boards; Library stamps to endpapers; Text pages clean & unmarked; Excellent binding with a straight spine; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); 2.1 lbs; Tan dust jacket with title in red lettering; 1989, Wiley-Interscience Publishing; 608 pages; "Ionizing Radiation Effects in MOS Devices and Circuits," by T. P. Ma & Paul V. Dressendorfer. Bestandsnummer des Verkäufers SKU-1328AE05602095
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Ionizing Radiation Effects in MOS Devices and Circuits
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Ionizing Radiation Effects in MOS Devices and Circuits
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Ionizing Radiation Effects in MOS Devices and Circuits
Verlag:
Wiley-Interscience Publishing, 1989
ISBN 10: 047184893X
ISBN 13: 9780471848936
Gebraucht
Hardcover
Anbieter: Salish Sea Books, Bellingham, WA, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: Good. Good++ in a Very Good dust jacket; Hardcover; Dust jacket is clean and intact with no tears, just moderate edgewear, and has not been price-clipped (Now fitted with a new, Brodart jacket protector); Unblemished textblock edges; Name inside the front cover; Light pen markings to just three pages, otherwise the endpapers and all text pages are clean and unmarked; The binding is excellent with a straight spine; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); 2.1 lbs; Tan dust jacket with title in red lettering; 1989, Wiley-Interscience Publishing; 608 pages; "Ionizing Radiation Effects in MOS Devices and Circuits," by T. P. Ma & Paul V. Dressendorfer. Bestandsnummer des Verkäufers SKU-0068AD01108153
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Ionizing Radiation Effects in MOS Devices and Circuits
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Ionizing Radiation Effects in MOS Devices and Circuits
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Ionizing Radiation Effects in MOS Devices and Circuits
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Ionizing Radiation Effects in Mos Devices and Circuits
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Ionizing Radiation Effects in MOS Devices and Circuits (Hardcover)
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John Wiley & Sons Inc, New York, 1989
ISBN 10: 047184893X
ISBN 13: 9780471848936
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Hardcover. Zustand: new. Hardcover. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Bestandsnummer des Verkäufers 9780471848936
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Ionizing Radiation Effects in MOS Devices and Circuits (Hardcover)
Verlag:
John Wiley & Sons Inc, New York, 1989
ISBN 10: 047184893X
ISBN 13: 9780471848936
Neu
Hardcover
Erstausgabe
Anbieter: AussieBookSeller, Truganina, VIC, Australien
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Hardcover. Zustand: new. Hardcover. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Bestandsnummer des Verkäufers 9780471848936
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