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Wafer-Level Integrated Systems: Implementation Issues (The Springer International Series in Engineering and Computer Science, Band 70) - Softcover
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From the perspective of complex systems, conventional Ie's can be regarded as "discrete" devices interconnected according to system design objectives imposed at the circuit board level and higher levels in the system implementation hierarchy. However, silicon monolithic circuits have progressed to such complex functions that a transition from a philosophy of integrated circuits (Ie's) to one of integrated sys tems is necessary. Wafer-scale integration has played an important role over the past few years in highlighting the system level issues which will most significantly impact the implementation of complex monolithic systems and system components. Rather than being a revolutionary approach, wafer-scale integration will evolve naturally from VLSI as defect avoidance, fault tolerance and testing are introduced into VLSI circuits. Successful introduction of defect avoidance, for example, relaxes limits imposed by yield and cost on Ie dimensions, allowing the monolithic circuit's area to be chosen according to the natural partitioning of a system into individual functions rather than imposing area limits due to defect densities. The term "wafer level" is perhaps more appropriate than "wafer-scale". A "wafer-level" monolithic system component may have dimensions ranging from conventional yield-limited Ie dimensions to full wafer dimensions. In this sense, "wafer-scale" merely represents the obvious upper practical limit imposed by wafer sizes on the area of monolithic circuits. The transition to monolithic, wafer-level integrated systems will require a mapping of the full range of system design issues onto the design of monolithic circuit.
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Wafer-Level Integrated Systems
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Zustand: Bueno. : Este libro trata sobre los sistemas integrados a nivel de oblea y los problemas de implementación relacionados. Cubre temas de ingeniería, sistemas informáticos y arquitectura VLSI. Es una publicación de Springer US y forma parte de la serie Kluwer International Series in Engineering and Computer Science. EAN: 9781461288985 Tipo: Libros Categoría: Tecnología|Ciencias Título: Wafer-Level Integrated Systems Autor: Stuart K. Tewksbury Editorial: Springer US Idioma: en Páginas: 480 Formato: Tapa blanda Año de publicación: 1989. Bestandsnummer des Verkäufers Happ-2026-07-02-091912fd
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Wafer-Level Integrated Systems
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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -From the perspective of complex systems, conventional Ie's can be regarded as 'discrete' devices interconnected according to system design objectives imposed at the circuit board level and higher levels in the system implementation hierarchy. However, silicon monolithic circuits have progressed to such complex functions that a transition from a philosophy of integrated circuits (Ie's) to one of integrated sys tems is necessary. Wafer-scale integration has played an important role over the past few years in highlighting the system level issues which will most significantly impact the implementation of complex monolithic systems and system components. Rather than being a revolutionary approach, wafer-scale integration will evolve naturally from VLSI as defect avoidance, fault tolerance and testing are introduced into VLSI circuits. Successful introduction of defect avoidance, for example, relaxes limits imposed by yield and cost on Ie dimensions, allowing the monolithic circuit's area to be chosen according to the natural partitioning of a system into individual functions rather than imposing area limits due to defect densities. The term 'wafer level' is perhaps more appropriate than 'wafer-scale'. A 'wafer-level' monolithic system component may have dimensions ranging from conventional yield-limited Ie dimensions to full wafer dimensions. In this sense, 'wafer-scale' merely represents the obvious upper practical limit imposed by wafer sizes on the area of monolithic circuits. The transition to monolithic, wafer-level integrated systems will require a mapping of the full range of system design issues onto the design of monolithic circuit. 476 pp. Englisch. Bestandsnummer des Verkäufers 9781461288985
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Wafer-Level Integrated Systems
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Springer, Springer Feb 2012, 2012
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ISBN 13: 9781461288985
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Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -From the perspective of complex systems, conventional Ie's can be regarded as 'discrete' devices interconnected according to system design objectives imposed at the circuit board level and higher levels in the system implementation hierarchy. However, silicon monolithic circuits have progressed to such complex functions that a transition from a philosophy of integrated circuits (Ie's) to one of integrated sys tems is necessary. Wafer-scale integration has played an important role over the past few years in highlighting the system level issues which will most significantly impact the implementation of complex monolithic systems and system components. Rather than being a revolutionary approach, wafer-scale integration will evolve naturally from VLSI as defect avoidance, fault tolerance and testing are introduced into VLSI circuits. Successful introduction of defect avoidance, for example, relaxes limits imposed by yield and cost on Ie dimensions, allowing the monolithic circuit's area to be chosen according to the natural partitioning of a system into individual functions rather than imposing area limits due to defect densities. The term 'wafer level' is perhaps more appropriate than 'wafer-scale'. A 'wafer-level' monolithic system component may have dimensions ranging from conventional yield-limited Ie dimensions to full wafer dimensions. In this sense, 'wafer-scale' merely represents the obvious upper practical limit imposed by wafer sizes on the area of monolithic circuits. The transition to monolithic, wafer-level integrated systems will require a mapping of the full range of system design issues onto the design of monolithic circuit.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 476 pp. Englisch. Bestandsnummer des Verkäufers 9781461288985
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Wafer-Level Integrated Systems : Implementation Issues
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - From the perspective of complex systems, conventional Ie's can be regarded as 'discrete' devices interconnected according to system design objectives imposed at the circuit board level and higher levels in the system implementation hierarchy. However, silicon monolithic circuits have progressed to such complex functions that a transition from a philosophy of integrated circuits (Ie's) to one of integrated sys tems is necessary. Wafer-scale integration has played an important role over the past few years in highlighting the system level issues which will most significantly impact the implementation of complex monolithic systems and system components. Rather than being a revolutionary approach, wafer-scale integration will evolve naturally from VLSI as defect avoidance, fault tolerance and testing are introduced into VLSI circuits. Successful introduction of defect avoidance, for example, relaxes limits imposed by yield and cost on Ie dimensions, allowing the monolithic circuit's area to be chosen according to the natural partitioning of a system into individual functions rather than imposing area limits due to defect densities. The term 'wafer level' is perhaps more appropriate than 'wafer-scale'. A 'wafer-level' monolithic system component may have dimensions ranging from conventional yield-limited Ie dimensions to full wafer dimensions. In this sense, 'wafer-scale' merely represents the obvious upper practical limit imposed by wafer sizes on the area of monolithic circuits. The transition to monolithic, wafer-level integrated systems will require a mapping of the full range of system design issues onto the design of monolithic circuit. Bestandsnummer des Verkäufers 9781461288985
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