VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings (Communications in Computer and Information Science, Band 382) - Softcover

 
9783642420238: VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings (Communications in Computer and Information Science, Band 382)
Softcover
ISBN 10: 3642420230 ISBN 13: 9783642420238
Verlag: Springer, 2013

Inhaltsangabe

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
Springer
Erscheinungsdatum
2013
Sprache
Englisch
ISBN 10 
3642420230
ISBN 13 
9783642420238
Einband
Taschenbuch
Anzahl der Seiten
404
Herausgeber
Gaur Manoj Singh, Zwolinski Mark, Laxmi Vijay, Boolchandani D., Sing Virendra, Singh Adit
Kontakt zum Hersteller
ProductSafety@springernature.com
ProductSafety@springernature.com

Poststr. 9
Darmstadt
64293
Deutschland

Weitere beliebte Ausgaben desselben Titels

9783642420252: VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Vorgestellte Ausgabe

ISBN 10:  3642420257 ISBN 13:  9783642420252
Verlag: Springer, 2013
Softcover