Verwandte Artikel zu Structural Analysis of Point Defects in Solids: An...

Structural Analysis of Point Defects in Solids: An Introduction to Multiple Magnetic Resonance Spectroscopy (Springer Series in Solid-State Sciences, Band 43) - Softcover

Spaeth, Johann-Martin; Niklas, Jürgen R.; Bartram, Ralph H.

 
9783642844072: Structural Analysis of Point Defects in Solids: An Introduction to Multiple Magnetic Resonance Spectroscopy (Springer Series in Solid-State Sciences, Band 43)
Softcover
ISBN 10: 3642844073 ISBN 13: 9783642844072
Verlag: Springer, 2012

Inhaltsangabe

Strutural Analysis of Point Defects in Solids introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy essentialfor applications to the determination of microscopic defect structures. Investigations of the microscopic and electronic structure, and also correlations with the magnetic propertiesof solids, require various multiple magnetic resonance methods, such as ENDOR and optically detected EPR or ENDOR. This book discusses experimental, technological and theoretical aspects of these techniques comprehensively, from a practical viewpoint, with many illustrative examples taken from semiconductors and other solids. The nonspecialist is informed about the potential of the different methods, while the researcher faced with the task of determining defect structures isprovided with the necessary tools, together with much information on computer-aided methods of data analysis and the principles of modern spectrometer design.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Über die Autorin bzw. den Autor

Structural Analysis of Point Defects in Solids provides a comprehensive introduction to the principles and techiques of modern electron paramagnetic resonance spectroscopy applied to the determination of microscopic defect structures. It informs the nonspecialist about the potential of the different methods, while the researcher faced with the task of determining defect structures will find here the necessary tools. The book will be useful for materials scientists working in semiconductor physics, laser physics, radiation damage, etc., and also for mineralogists and solid state chemists.

Von der hinteren Coverseite

Structural Analysis of Point Defects in Solids provides a comprehensive introduction to the principles and techiques of modern electron paramagnetic resonance spectroscopy applied to the determination of microscopic defect structures. It informs the nonspecialist about the potential of the different methods, while the researcher faced with the task of determining defect structures will find here the necessary tools. The book will be useful for materials scientists working in semiconductor physics, laser physics, radiation damage, etc., and also for mineralogists and solid state chemists.

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
Springer
Erscheinungsdatum
2012
Sprache
Englisch
ISBN 10 
3642844073
ISBN 13 
9783642844072
Einband
Taschenbuch
Anzahl der Seiten
378
Kontakt zum Hersteller
Springer Nature Customer Service Center GmbH
ProductSafety@springernature.com

Europaplatz 3
Heidelberg
69115
Deutschland