Fey goerschwin (42 Ergebnisse)

Paperback. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

XIV, 171 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Sprache: Englisch.

Zustand: As New. Unread book in perfect condition.

Zustand: New.

Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Zustand: New. pp. 171.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Hardcover. Zustand: Brand New. 2015 edition. 171 pages. 9.25x6.25x0.75 inches. In Stock.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Taschenbuch. Zustand: Neu. Robustness and Usability in Modern Design Flows | Görschwin Fey (u. a.) | Taschenbuch | xviii | Englisch | 2010 | Springer | EAN 9789048176625 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Paperback. Zustand: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Hardcover. Zustand: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Paperback. Zustand: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Paperback. Zustand: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Hardcover. Zustand: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Paperback. Zustand: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Zustand: New.

Paperback. Zustand: New. Eingebettete Systeme übernehmen zentrale Steueraufgaben im täglichen Leben. In der Energieversorgung oder im Transportwesen würde ein Ausfall der Systeme fatale Auswirkungen haben. Der Nutzer verlässt sich aber auf ein fehlerfreies Funktionieren des Systems. Die Funktionstüchtigkeit der Schaltkreise zu garantieren, ist das Ziel des Testens - und das mit geringen Kosten, da jeder Chip nach der Produktion separat getestet werden muss.…

Zustand: As New. Unread book in perfect condition.

Zustand: new.

Zustand: New.

Zustand: As New. Unread book in perfect condition.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Embedded systems are assuming key control functions in everyday life. Systemic failure in the energy supply or the transport sector could lead to fatal consequences. Users place great reliance on the error-free function of such systems. Guaranteeing the functional capability of digital circuits is the goal of testing - and this aim must be achieved at low cost, since every chip has to be tested separately after production.; Eingebettete Systeme übernehmen zentrale Steueraufgaben im täglichen Leben. In der Energieversorgung oder im Transportwesen würde ein Ausfall der Systeme fatale Auswirkungen haben. Der Nutzer verlässt sich aber auf ein fehlerfreies Funktionieren des Systems. Die Funktionstüchtigkeit der Schaltkreise zu garantieren, ist das Ziel des Testens - und das mit geringen Kosten, da jeder Chip nach der Produktion separat getestet werden muss.…

Paperback. Zustand: Brand New. 238 pages. German language. 9.45x6.69x0.55 inches. In Stock.

Zustand: New. In German.

Paperback. Zustand: New. Eingebettete Systeme übernehmen zentrale Steueraufgaben im täglichen Leben. In der Energieversorgung oder im Transportwesen würde ein Ausfall der Systeme fatale Auswirkungen haben. Der Nutzer verlässt sich aber auf ein fehlerfreies Funktionieren des Systems. Die Funktionstüchtigkeit der Schaltkreise zu garantieren, ist das Ziel des Testens - und das mit geringen Kosten, da jeder Chip nach der Produktion separat getestet werden muss.…

Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs. 188 pp. Englisch.…

Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs. 188 pp. Englisch.…

Zustand: New. Print on Demand pp. 171.

Zustand: new. Questo è un articolo print on demand.