Isbn: 9780780310001 - semiconductor memories: technology, testing, and reliability (27 Ergebnisse)

Hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Hardcover. Zustand: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Zustand: Acceptable. Item in acceptable condition! Textbooks may not include supplemental items i.e. CDs, access codes etc.

Zustand: Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc.

Zustand: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.

hardcover. Zustand: Good. Ex-library book with typical stickers and stampings. Priority Mail is available on this item. No international shipping.

Zustand: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1150grams, ISBN:9780780310001.…

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 476 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Zustand: Sehr gut. Auflage: 1. 480 Seiten kleine Lagerspuren am Buch, Inhalt einwandfrei und ungelesen Sprache: Englisch Gewicht in Gramm: 1030 25,7 x 18,0 x 3,3 cm, Gebundene Ausgabe.

Zustand: New.

hardcover. Zustand: new.

HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Zustand: new.

Zustand: New.

Zustand: As New. Unread book in perfect condition.

Zustand: New. In English.

Zustand: As New. Unread book in perfect condition.

Zustand: New.

Zustand: New. Num Pages: 480 pages, illustrations. BIC Classification: UKS. Category: (UU) Undergraduate. Dimension: 258 x 183 x 29. Weight in Grams: 950. . 2002. 1st Edition. Hardcover. . . . .

Gebunden. Zustand: New. Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.* Memory cell structures and fabrication technologies.* Application-specif.

Hardcover. Zustand: Brand New. 1st edition. 480 pages. 10.50x7.50x1.25 inches. In Stock.

Zustand: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

Zustand: New. Num Pages: 480 pages, illustrations. BIC Classification: UKS. Category: (UU) Undergraduate. Dimension: 258 x 183 x 29. Weight in Grams: 950. . 2002. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.

Buch. Zustand: Neu. Neuware - Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.\* Memory cell structures and fabrication technologies.\* Application-specific memories and architectures.\* Memory design, fault modeling and test algorithms, limitations, and trade-offs.\* Space environment, radiation hardening process and design techniques, and radiation testing.\* Memory stacks and multichip modules for gigabyte storage.…

Zustand: New. pp. 480 This item is printed on demand.

Hardcover. Zustand: new. Hardcover. Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage. Provides in depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods, including: memory cell structures and fabrication technologies; application specific memories and architectures; and memory design, fault modeling and test algorithms, limitations, and trade offs. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Hardcover. Zustand: Brand New. 1st edition. 480 pages. 10.50x7.50x1.25 inches. In Stock. This item is printed on demand.