New methods concurrent checking von gössel michael (21 Ergebnisse)
New Methods Of Concurrent Checking (frontiers In Electronic Testing)
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Sprache: Englisch
Verlag: Springer 2008
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
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Sprache: Englisch
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New Methods Of Concurrent Checking: Preliminary Entry 42
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Sprache: Englisch
Verlag: Springer 2008
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
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New Methods Of Concurrent Checking: Preliminary Entry 42
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Sprache: Englisch
Verlag: Springer 2008
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
- Hardcover
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New Methods of Concurrent Checking (Frontiers in Electronic Testing, 42)
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Sprache: Englisch
Verlag: Springer 2008
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
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New Methods of Concurrent Checking
Goessel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Sprache: Englisch
Verlag: Springer 2008
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
- Hardcover
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New Methods of Concurrent Checking
Gossel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Sprache: Englisch
Verlag: Springer 2010
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
- Softcover
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New Methods of Concurrent Checking (Frontiers in Electronic Testing, 42)
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Sprache: Englisch
Verlag: Springer 2010
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
- Softcover
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Weitere BilderSprache: Englisch
Verlag: Springer 2010
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Taschenbuch. Zustand: Neu. New Methods of Concurrent Checking | Michael Gössel (u. a.) | Taschenbuch | viii | Englisch | 2010 | Springer | EAN 9789048178766 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Sprache: Englisch
Verlag: Springer, Springer 2010
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or… customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected.
Sprache: Englisch
Verlag: Springer 2008
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
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Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or custom…ers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected.
New Methods of Concurrent Checking (Frontiers in Electronic Testing (42))
Gössel, Michael, Ocheretny, Vitaly, Sogomonyan, Egor, Marien
Sprache: Englisch
Verlag: Springer 2010
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
- Softcover
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New Methods of Concurrent Checking
Gossel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Sprache: Englisch
Verlag: Springer 2010
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
- Softcover
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New Methods of Concurrent Checking (Frontiers in Electronic Testing)
Gössel, Michael, Ocheretny, Vitaly, Sogomonyan, Egor, Marien
Sprache: Englisch
Verlag: Springer 2008
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
- Hardcover
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New Methods of Concurrent Checking
Goessel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Sprache: Englisch
Verlag: Springer 2008
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
- Hardcover
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Sprache: Englisch
Verlag: Springer Netherlands Okt 2010 2010
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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a di…gital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected. 192 pp. Englisch.
Sprache: Englisch
Verlag: SPRINGER NATURE Mai 2008 2008
Serie: Frontiers in Electronic Testing, Buch 20 von 40. Buch 20 von 40 - Frontiers in Electronic Testing
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Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital l…ibrary or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected. 182 pp. Englisch.
Sprache: Englisch
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Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Of great importance for the emerging nanotechnologies with their increasing numbers of transient faultsShows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designedThe… only book which desc.
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Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Of great importance for the emerging nanotechnologies with their increasing numbers of transient faultsShows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designedThe… only book which desc.
Sprache: Englisch
Verlag: Springer, Springer Okt 2010 2010
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Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digita…l library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 192 pp. Englisch.
