Sprache: Englisch
Verlag: French Bread Publications, 2006
ISBN 10: 097690490X ISBN 13: 9780976904908
Anbieter: Books of Paradise, Magalia, CA, USA
Softcover. Zustand: Near Fine. Review Copy. Review copy sticker on front cover, very slight edgewear; 320 pages.
Sprache: Englisch
Verlag: French Bread Publications, 2006
ISBN 10: 097690490X ISBN 13: 9780976904908
Anbieter: World of Books (was SecondSale), Montgomery, IL, USA
Zustand: Good. Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc.
Sprache: Englisch
Verlag: French Bread Publications, 2006
ISBN 10: 097690490X ISBN 13: 9780976904908
Anbieter: Bookmans, Tucson, AZ, USA
Paperback. Zustand: Good. Satisfaction 100% guaranteed.
Zustand: New.
Paperback. Zustand: New.
Zustand: As New. Unread book in perfect condition.
Anbieter: Rarewaves.com USA, London, LONDO, Vereinigtes Königreich
EUR 18,96
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In den WarenkorbPaperback. Zustand: New.
Verlag: English, 2014
ISBN 10: 9350450712 ISBN 13: 9789350450710
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 7,90
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In den WarenkorbZustand: New. pp. 92.
Verlag: English, 2014
ISBN 10: 9350450712 ISBN 13: 9789350450710
Anbieter: Books Puddle, New York, NY, USA
Zustand: New. pp. 92.
Verlag: English, 2014
ISBN 10: 9350450712 ISBN 13: 9789350450710
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Zustand: New. pp. 92.
Sprache: Englisch
Verlag: Springer International Publishing AG, Cham, 2016
ISBN 10: 3031009029 ISBN 13: 9783031009020
Anbieter: Grand Eagle Retail, Bensenville, IL, USA
Paperback. Zustand: new. Paperback. RRAM technology has made significant progress in the past decade as a competitive candidate for the next generation non-volatile memory (NVM). This lecture is a comprehensive tutorial of metal oxide-based RRAM technology from device fabrication to array architecture design. State-of-the-art RRAM device performances, characterization, and modeling techniques are summarized, and the design considerations of the RRAM integration to large-scale array with peripheral circuits are discussed. Chapter 2 introduces the RRAM device fabrication techniques and methods to eliminate the forming process, and will show its scalability down to sub-10 nm regime. Then the device performances such as programming speed, variability control, and multi-level operation are presented, and finally the reliability issues such as cycling endurance and data retention are discussed. Chapter 3 discusses the RRAM physical mechanism, and the materials characterization techniques to observe the conductive filaments andthe electrical characterization techniques to study the electronic conduction processes. It also presents the numerical device modeling techniques for simulating the evolution of the conductive filaments as well as the compact device modeling techniques for circuit-level design. Chapter 4 discusses the two common RRAM array architectures for large-scale integration: one-transistor-one-resistor (1T1R) and cross-point architecture with selector. The write/read schemes are presented and the peripheral circuitry design considerations are discussed. Finally, a 3D integration approach is introduced for building ultra-high density RRAM array. Chapter 5 is a brief summary and will give an outlook for RRAMs potential novel applications beyond the NVM applications. State-of-the-art RRAM device performances, characterization, and modeling techniques are summarized, and the design considerations of the RRAM integration to large-scale array with peripheral circuits are discussed. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
EUR 19,12
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In den WarenkorbZustand: New.
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
EUR 22,12
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In den WarenkorbZustand: As New. Unread book in perfect condition.
EUR 29,69
Anzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 78 pages. 9.25x7.51x9.25 inches. In Stock.
Anbieter: Books Puddle, New York, NY, USA
Zustand: New. 1st edition NO-PA16APR2015-KAP.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 33,04
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In den WarenkorbZustand: New. In.
Sprache: Englisch
Verlag: Morgan & Claypool Publishers, 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Anbieter: Our Kind Of Books, Liphook, Vereinigtes Königreich
EUR 23,76
Anzahl: 2 verfügbar
In den WarenkorbSoft cover. Zustand: As New. This book has been in storage since publication and is unread. Hence the description as new. Synopsis: RRAM technology has made significant progress in the past decade as a competitive candidate for the next generation non-volatile memory (NVM). This lecture is a comprehensive tutorial of metal oxide-based RRAM technology from device fabrication to array architecture design. State-of-the-art RRAM device performances, characterization, and modeling techniques are summarized, and the design considerations of the RRAM integration to large-scale array with peripheral circuits are discussed.
Sprache: Englisch
Verlag: Morgan & Claypool Publishers, 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Anbieter: Basi6 International, Irving, TX, USA
Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Sprache: Englisch
Verlag: Morgan & Claypool Publishers (edition ), 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Anbieter: BooksRun, Philadelphia, PA, USA
Paperback. Zustand: Very Good. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
Sprache: Englisch
Verlag: Morgan & Claypool Publishers (edition ), 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Anbieter: BooksRun, Philadelphia, PA, USA
Paperback. Zustand: Very Good. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
Sprache: Englisch
Verlag: Morgan & Claypool Publishers (edition ), 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Anbieter: BooksRun, Philadelphia, PA, USA
Paperback. Zustand: New. The item is brand new, never used or read. It's in perfect condition and may include supplements and/or access codes or come shrink-wrapped.
Anbieter: Rarewaves USA United, OSWEGO, IL, USA
EUR 19,11
Anzahl: Mehr als 20 verfügbar
In den WarenkorbPaperback. Zustand: New.
Zustand: good. This is a pre-loved book that shows moderate signs of wear from previous reading. You may notice creases, edge wear, or a cracked spine, but it remains in solid, readable condition.Please note:-May include library or rental stickers, stamps, or markings.-Supplemental materials e.g., CDs, access codes, inserts are not guaranteed.-Box sets may not come with the original outer box. If it does, the box will not be in perfect condition. -Sourced from donation centers; authenticity not verified with publisher. Your satisfaction is our top priority! If you have any questions or concerns about your order, please don't hesitate to reach out. Thank you for shopping with us and supporting small businessâ"happy reading!
Zustand: good. This is a pre-loved book that shows moderate signs of wear from previous reading. You may notice creases, edge wear, or a cracked spine, but it remains in solid, readable condition.Please note:-May include library or rental stickers, stamps, or markings.-Supplemental materials e.g., CDs, access codes, inserts are not guaranteed.-Box sets may not come with the original outer box. If it does, the box will not be in perfect condition. -Sourced from donation centers; authenticity not verified with publisher. Your satisfaction is our top priority! If you have any questions or concerns about your order, please don't hesitate to reach out. Thank you for shopping with us and supporting small businessâ"happy reading!
Zustand: good. This is a pre-loved book that shows moderate signs of wear from previous reading. You may notice creases, edge wear, or a cracked spine, but it remains in solid, readable condition.Please note:-May include library or rental stickers, stamps, or markings.-Supplemental materials e.g., CDs, access codes, inserts are not guaranteed.-Box sets may not come with the original outer box. If it does, the box will not be in perfect condition. -Sourced from donation centers; authenticity not verified with publisher. Your satisfaction is our top priority! If you have any questions or concerns about your order, please don't hesitate to reach out. Thank you for shopping with us and supporting small businessâ"happy reading!
Anbieter: World of Books (was SecondSale), Montgomery, IL, USA
Zustand: Good. Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc.
Sprache: Englisch
Verlag: LAP LAMBERT Academic Publishing, 2023
ISBN 10: 6206782441 ISBN 13: 9786206782445
Anbieter: Books Puddle, New York, NY, USA
Zustand: New.
Sprache: Englisch
Verlag: LAP LAMBERT Academic Publishing, 2023
ISBN 10: 6206782441 ISBN 13: 9786206782445
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 75,91
Anzahl: 4 verfügbar
In den WarenkorbZustand: New.
Sprache: Englisch
Verlag: Springer International Publishing AG, Cham, 2016
ISBN 10: 3031009029 ISBN 13: 9783031009020
Anbieter: AussieBookSeller, Truganina, VIC, Australien
Paperback. Zustand: new. Paperback. RRAM technology has made significant progress in the past decade as a competitive candidate for the next generation non-volatile memory (NVM). This lecture is a comprehensive tutorial of metal oxide-based RRAM technology from device fabrication to array architecture design. State-of-the-art RRAM device performances, characterization, and modeling techniques are summarized, and the design considerations of the RRAM integration to large-scale array with peripheral circuits are discussed. Chapter 2 introduces the RRAM device fabrication techniques and methods to eliminate the forming process, and will show its scalability down to sub-10 nm regime. Then the device performances such as programming speed, variability control, and multi-level operation are presented, and finally the reliability issues such as cycling endurance and data retention are discussed. Chapter 3 discusses the RRAM physical mechanism, and the materials characterization techniques to observe the conductive filaments andthe electrical characterization techniques to study the electronic conduction processes. It also presents the numerical device modeling techniques for simulating the evolution of the conductive filaments as well as the compact device modeling techniques for circuit-level design. Chapter 4 discusses the two common RRAM array architectures for large-scale integration: one-transistor-one-resistor (1T1R) and cross-point architecture with selector. The write/read schemes are presented and the peripheral circuitry design considerations are discussed. Finally, a 3D integration approach is introduced for building ultra-high density RRAM array. Chapter 5 is a brief summary and will give an outlook for RRAMs potential novel applications beyond the NVM applications. State-of-the-art RRAM device performances, characterization, and modeling techniques are summarized, and the design considerations of the RRAM integration to large-scale array with peripheral circuits are discussed. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Zustand: New.