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Taschenbuch. Zustand: Neu. VLSI Design and Test | 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers | Brajesh Kumar Kaushik (u. a.) | Taschenbuch | xxi | Englisch | 2017 | Springer | EAN 9789811074691 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Verlag: Springer Nature Singapore, Springer Nature Singapore Dez 2017, 2017
ISBN 10: 9811074690 ISBN 13: 9789811074691
Sprache: Englisch
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Taschenbuch. Zustand: Neu. Neuware -This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 840 pp. Englisch.
Verlag: Springer-Verlag New York Inc, 2018
ISBN 10: 9811074690 ISBN 13: 9789811074691
Sprache: Englisch
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In den WarenkorbGebunden. Zustand: New. Brajesh Kumar Kaushik received Ph.D. degree in 2007 from Indian Institute of Technology Roorkee, India. He served Vinytics Peripherals Pvt. Ltd., Delhi, as Research and Development Engineer in microprocessor, microcontroller, and DSP (Di.
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Verlag: Springer Nature Singapore Dez 2017, 2017
ISBN 10: 9811074690 ISBN 13: 9789811074691
Sprache: Englisch
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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. 840 pp. Englisch.
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In den WarenkorbKartoniert / Broschiert. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and .